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A Robust Completed Local Binary Pattern (RCLBP) for Surface Defect Detection

Nana Kankam Gyimah, Abeneezer Girma, Mahmoud Nabil Mahmoud, Shamila Nateghi, Abdollah Homaifar, Daniel Opoku

  • SMCS
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    Length: 00:12:21

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  • SMCS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00
  • SMCS
    Members: Free
    IEEE Members: $11.00
    Non-members: $15.00